Metrology
Lorem ipsum dolor sit amet, consectetur adipiscing elit. Aenean euismod bibendum laoreet. Proin gravida dolor sit amet lacus accumsan et viverra justo commodo.
A Comprehensive Metrology and Quality System
Yudi Optics employs a wide variety of metrology equipment to ensure the quality of our in-house optics manufacturing and assemblies. Our metrology equipment, including interferometers, profilometers, spectrophotometers, and coordinate measurement machines (CMMs), is one component of our strict global quality program. They are not only applied in our measuring room but also employed directly in production, from material inspection, CNC machining, grinding, and polishing to coating, conducted at every stage of the processing for immediate results control and perfect final result. We also conduct in-house testing of imaging performance and environmental testing for temperature, humidity, shock, and vibration. Yudi Optics has a proven track record of tailored testing for custom optical assemblies. Product testing and certification reports are also available upon request.
Specifications and Tolerances Capabilities
Down to ± 0.005mm
Our current coating wavelength range from 193nm – 14µm, covering UV, visible, mid-IR and far IR.
The size of optics we can coated ranges from 5 mm to 1,000mm, sooner it will grow up to 2,000mm in 2024.
Our thin-film coatings include but are not limited to oxide and fluoride dielectric multilayer coating materials including MgF2, SiO2, Ta2O5, HfO2, and dozens more
Our Coating capabilities include:
We test to the following criteria and performance specifications: MIL-F-48616 / MIL-C-675C / MIL-STD-810G / ISO-92114 & ISO9022-2/12.
Precision Result, Contactless, Fast and Safe.
Whether flatness, surface shape, angle, roughness, or waviness, we employed ZYGO HD series interferometers to detect the smallest disturbances as long as the components reflect or almost reflect. Only with such devices can shape deviations in the range of 10 nm to 100 nm nanometers be reliably detected.
Significant Features, Technologies, Datas
Surface roughness, coating film thickness, and refractive index are critical parameters that demand precision. At Yudi, we tackle these challenges with state-of-the-art technology, ensuring accuracy in every detail. With Yudi, you can trust that your optical components are scrutinized with the utmost precision, meeting the highest standards in the industry.
Zeiss Coordinate Measuring Machine (CMM)
Leveraging the Zeiss CMM, we conduct comprehensive three-dimensional coordinate measurements on optical components, to verify that the overall dimensions align with design specifications. The precision of the CMM extends to meticulously measuring contours and surfaces, ensuring adherence to the intricate geometry of the design.
Environment Tests We Conduct
Our critical optical components are able to withstand the rigors of the most severe environments in defense and industrial applications. All tests, where applicable, are carried out per MIL or ISO specifications and on a representative witness piece coated in the same batch.
A standard test performed over 24 hours in 98% relative humidity at 49°C.
Our standard salt solution test will last over 24 hours.
A circle test, typically between -62°C and + 71°C for 5 hours each.
To test the abrasions on optics caused by different objects at a known pressure.
A standard test performed using adhesive tape to a known specification.
Test to ensure optics will survive the worst care handling and shipping environments.
Large Aperture Optics Metrology
Our laboratory is fully functionally equipped with cutting-edge instruments, including CCD cameras, automatic interferometers, laser interferometers, microscopes, et to conduct the most complicated metrology of large optics.
Aspheric Optic Metrology
To overcome the most challenging metrology of aspheric optics, Yudi employs the top-tier equipment required for various technologies used to test aspheric optical components, including CCD cameras, ZYGO interferometers, white light interferometers, laser interferometers, three-coordinate systems, optical profilers, and optical microscopes.